Mega-Challenge Participants Given More Opportunity

This year, the three finalist teams for the IEEE Educational Mega-Challenge: Smart Cities were given a wider remit in that they were not constrained to just using RAIN RFID technologies. Teams from Florida Institute of Technology, a combined team representing R & N Systems Design (from Christian Brothers University and the University of Memphis), and Washington University in St. Louis rose to the challenge and provided solutions that addressed farming, tool tracking, and RFID-enabled roadways respectively. Washington University in St. Louis won with their “Pathway to Smart Infrastructure: Hybrid RFID” solution after delivering a well-rehearsed presentation and surviving a rigorous cross-examination by a panel of ten industry judges.

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2019 IEEE RFID Smart Cities Educational Mega Challenge Announced

The IEEE Council on RFID once again challenges undergraduate engineering students to team up to offer a Smart Cities problem and solution. The competition, introduced in 2017, draws proposals from around the world. After the finalists are selected, they each present a 3-minute video, followed by a live presentation at the IEEE RFID 2019 Conference in Phoenix, Arizona. Challengers are at their best answering tough questions in real-time from the judges from RAIN RFID Alliance, AIM Global, and RFID Journal Live! representatives. The finalists received a trophy for their school, certificates for each team member, and split $5,000 student travel grants donated by RAIN and IEEE CRFID. If you are

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IEEE RFID 2018 Best Paper Recipient Named

Best Paper: M. Alhassoun, M. A. Varner and G. D. Durgin, “Design and evaluation of a multi-modulation retrodirective RFID tag,” 2018 IEEE International Conference on RFID (RFID), Orlando, FL, 2018, pp. 1-8. doi: 10.1109/RFID.2018.8376197 Best Paper – Honorable Mention:  E. A. Keehr, “A low-cost software-defined UHF RFID reader with active transmit leakage cancellation,” 2018 IEEE International Conference on RFID (RFID), Orlando, FL, 2018, pp. 1-8. doi: 10.1109/RFID.2018.8376193 Orlando, FL (April 2018) The IEEE Council on RFID (CRFID) announced today that Mohammad Alhassoun, Michael Varner and Gregory Durgin of Georgia Institute of Technology are the recipients of the Best Paper Award for the IEEE RFID 2018 technical conference co-located with RFID Journal Live! 2018. The

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